Strong, Alvin Wayne, Reliability Wearout Mechanisms in Advanced CMOS Technologies, IEEE Press, 2009. (Call no: TK7871.99.M44R382, E-book, E-book)
Strong, Alvin Wayne, Reliability Wearout Mechanisms in Advanced CMOS Technologies, IEEE Press, 2009. (Call no: TK7871.99.M44R382, E-book, E-book)