Reliability Wearout Mechanisms in Advanced CMOS Technologies
Strong, Alvin Wayne, Reliability Wearout Mechanisms in Advanced CMOS Technologies, IEEE Press, 2009. (Call no: TK7871.99.M44R382, E-book, E-book)
Strong, Alvin Wayne, Reliability Wearout Mechanisms in Advanced CMOS Technologies, IEEE Press, 2009. (Call no: TK7871.99.M44R382, E-book, E-book)
Charles R. Brooks, Ashok Choudury & Charlie R. Brooks, Failure analysis of Engineering materials, McGraw-Hill, 2002. (Call no: TA409.B873)
Ohring Milton, Reliability and Failure of Electronic Materials and Devices, Academic Press, 1998 (Call no: TK7870.23.H38)