College Physics
Alan Giambattista, College Physics, 1st Edition, McGraw-Hill, 2004 (Call no: QC21.3.G432)
Alan Giambattista, College Physics, 1st Edition, McGraw-Hill, 2004 (Call no: QC21.3.G432)
J.B. Park, R.S. Lakes, Biomaterials: an introduction, Plenum Press, 3rd Edition, 2007. (Call no: R857.M3P235 2007, E-book)
Ng-Loy Wee Loon, Law of Intellectual Property of Singapore, 2nd Edition, Thomson Sweet & Maxwell Asia, 2014 (Call no: KPP112.N576a 2014)
Basil M. Angelo, Lucas T. Mikeska, Michichiro Izumi, and Koichiro Nakanishi, Patent Law for Scientists and Engineers, 2016 Edition, LexisNexis, 2016 (Call no: KF3114.85.P295 2016)
Howard B. Rockman, Intellectual Property Law for Engineers and Scientists, John Wiley & Sons, Inc, 2004 (Call no: KF2979.R683, E-book)
Tina Hart, Simon Clark, Linda Fazzani, Intellectual Property Law, 6th Edition, Palgrave Macmillan, 2013 (Call no: KD1269.H326 2013)
Milton Ohring, The Materials Science of Thin Films: Deposition and Structure, 2nd Edition Academic press 2002 (Call no: TA418.9.T45H38 2002)
D.L. Smith, Thin-film Deposition : Principles and Practice, McGraw-Hill, 1995 (Call no: TA418.9.T45S645)
Jacob N Isrealachvili, Intermolecular and surface forces, 2nd edition, Elsevier, 1991 (Call no: QD461.I85)
Cao Guozhong, Nanostructures and Nanomaterials: Synthesis, Properties and Applications, Imperial College Press, 2004 (Call no: QC176.8.N35C235, E-book)
“X-ray diffraction, Rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials”, Handbook of Nanoceramics and Their Based Nanodevices, Vol. 3, p 303-336. American Scientific Publishers 2009, (Call no: TA418.9.N35H236HT V3)
David B. Williams and C. B. Carter, Transmission Electron Microscopy: A Textbook for Materials Science, 1996, Plenum Press (Call no: TA417.23.W716, TA417.23.W716 V1, TA417.23.W716 V2, TA417.23.W716 V3, TA417.23.W716 V4, E-book)
R. Wiesendanger, Scanning Probe Microscopy : analytical methods, Springer-Verlag, 1998. (Call no: QH212.S33S283sp, E-book)
M.H.Loretto, Electron beam analysis of materials, 2nd Edition, Chapman & Hall, 1994 (Call no: TA417.23.L869)
I.A.Watt, The principles and practice of electron microscopy, 2nd Edition, Cambridge, 1997 (Call no: QH212.E4W344 1997, E-book)
P.J.Goodhew, F.J.Humphreys, Electron Microscopy and Analysis, Taylor & Francis, 3rd Edition, 2001 (Call no: QH212.E4G652e 2001)
Elton N. Kaufmann, Characterization of Materials, John Wiley & Sons, 2012. (E-book)
M.G. Fontana, Corrosion Engineering, 3rd Edition, McGraw-Hill, 1987 (Call no: TA418.74.F679)
Barry Hull, Vernon John, Non-Destructive Testing, English Language Book Society, 1988 (Call no: TA417.2.H913)
ASM International. Handbook Committee, Metals Handbook, Volume 17: Nondestructive Evaluation and Quality Control, ASM International (Call no: TA459.A836A V17)