Proceedings Title
|
Copyright owner
|
2009 IEEE International Reliability Physics Symposium
(ISBN: 978-1-4244-2888-5)
(EISBN: 978-1-4244-2889-2)
|
Institute of Electrical and Electronics Engineers (IEEE) |
2010 IEEE International Reliability Physics Symposium (IRPS)
(ISBN: 978-1-4244-5430-3)
|
Institute of Electrical and Electronics Engineers (IEEE) |
2011 IEEE International Reliability Physics Symposium (IRPS)
(ISBN: 978-1-4244-9113-1)
(EISBN: 978-1-4244-9111-7)
|
Institute of Electrical and Electronics Engineers (IEEE) |
2012 IEEE International Reliability Physics Symposium (IRPS)
(ISBN: 978-1-4577-1678-2)
(EISBN: 978-1-4577-1679-9)
|
Institute of Electrical and Electronics Engineers (IEEE) |
2013 IEEE International Reliability Physics Symposium (IRPS)
(ISBN: 978-1-4799-0112-8)
(EISBN: 978-1-4799-0111-1 )
|
Institute of Electrical and Electronics Engineers (IEEE) |
2014 IEEE International Reliability Physics Symposium (IRPS)
(PISSN: 1541-7026)
|
Institute of Electrical and Electronics Engineers (IEEE) |