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Proceedings Title
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Copyright owner
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IPFA 1987
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Proceedings of the 2nd International Symposium on the Physical & Failure Analysis of Integrated Circuits, 1989
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Proceedings of the 3rd International Symposium on the Physical & Failure Analysis of Integrated Circuits, 1991
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IPFA 1993
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Proceedings Of The 1995 5th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 0-7803-2797-7)
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IEEE |
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Proceedings Of The 1997 6th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 0-7803-3985-1)
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IEEE |
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Proceedings Of The 1999 7th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 0-7803-5187-8)
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IEEE |
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Proceedings Of The 2001 8th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 0-7803-6675-1)
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IEEE |
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Proceedings Of The 2002 9th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 0-7803-7416-9)
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IEEE |
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Proceedings Of The 2003 10th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 0-7803-7722-2)
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IEEE |
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Proceedings Of The 2004 11th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 0-7803-8454-7)
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IEEE |
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Proceedings Of The 2005 12th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 0-7803-9301-5)
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IEEE |
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Proceedings Of The 2006 13th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 1-4244-0205-0)
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IEEE |
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Proceedings: The 2007 14th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 1-4244-1014-2)
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IEEE |
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Proceedings: The 2008 15th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 978-1-4244-2039-1)
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Proceedings: The 2009 16th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 978-1-4244-3911-9)
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IEEE |
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Proceedings: The 2010 17th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 978-1-4244-5596-6)
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IEEE |
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Proceedings: The 2011 18th International Symposium On The Physical And Failure Analysis Of Integrated Circuits
(ISBN: 978-1-4577-0159-7)
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